Skip to main navigation
Skip to search
Skip to main content
English
中文
Home
Profiles
Research Units
Research output
Projects
Prizes
Activities
Equipment
Impacts
Search by expertise, name or affiliation
Reliability study on BST capacitors for GaAs MMIC
Atsushi Noma
*
,
Daisuke Ueda
*
Corresponding author for this work
International College of Semiconductor Technology
Research output
:
Contribution to journal
›
Article
›
peer-review
12
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Reliability study on BST capacitors for GaAs MMIC'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Chemical Compounds
gallium arsenide
Monolithic microwave integrated circuits
Deep level transient spectroscopy
Capacitors
Electron energy levels
Grain boundaries
Temperature
Degradation
Engineering & Materials Science
Monolithic microwave integrated circuits
Deep level transient spectroscopy
Capacitors
Electron energy levels
Grain boundaries
Temperature
Degradation
Physics & Astronomy
capacitors
absorption cross sections
energy levels
degradation
grain size
grain boundaries
life (durability)
shift
temperature