Reliability Studies of Gain-Guided 0.85 μm GaAs/AlGaAs Quantum Well Surface Emitting Lasers

C. C. Wu, K. Tai, T. C. Huang, Kai-Feng Huang

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

A reliability study of gain-guided 0.85 μm GaAs/AlGaAs quantum well surface emitting lasers is reported for the first time. 32 lasers were randomly selected to operate at 25 or 50 C with bias currents up to 15 mA, about 4 times the threshold values. The power outputs of the 32 lasers showed no noticeable degradation after 2000–3000 hours of operation.

Original languageEnglish
Pages (from-to)37-39
Number of pages3
JournalIEEE Photonics Technology Letters
Volume6
Issue number1
DOIs
StatePublished - 1 Jan 1994

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