Reliability studies of 0.85-μm VCELs

K. Tai*, C. C. Wu, Kai-Feng Huang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The paper reports reliability studies on 45 randomly selected 0.85 micrometer vertical cavity surface emitting lasers (VCELs). These layers were prepared by one-step molecular beam epitaxy and proton implantation. The threshold currents at 25 °C vary from 3.8 to 4 mA. The biased voltages at the threshold vary from 2.2 to 2.3 V. The low bias voltage allows the maximum cw operating temperature of the lasers to exceed 100 °C.

Original languageEnglish
Title of host publicationConference on Optical Fiber Communication, Technical Digest Series
Pages105-106
Number of pages2
StatePublished - 1 Jan 1994
EventProceedings of the 1994 Optical Fiber Communication Conference - San Jose, CA, USA
Duration: 20 Feb 199425 Feb 1994

Publication series

NameConference on Optical Fiber Communication, Technical Digest Series
Volume4

Conference

ConferenceProceedings of the 1994 Optical Fiber Communication Conference
CitySan Jose, CA, USA
Period20/02/9425/02/94

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