Skip to main navigation
Skip to search
Skip to main content
English
中文
Home
Profiles
Research Units
Research Output
Projects
Prizes
Activities
Equipment
Impacts
Search by expertise, name or affiliation
Reliability issues of MOS and bipolar ICs
Chen-Ming Hu
*
*
Corresponding author for this work
International College of Semiconductor Technology
Research output
:
Contribution to conference
›
Paper
›
peer-review
8
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Reliability issues of MOS and bipolar ICs'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Engineering & Materials Science
Hot carriers
Electromigration
Oxides
Computer aided design
Statistics
Degradation
Defects
Networks (circuits)