Reliability analysis of GaN-based UVLEDs under forward bias operations in salty vapor environment

Shen Che Huang, Heng Li, Yu Shan Lee, Chen Hao Hung, Shing Chung Wang, Hsiang Chen, Tien-chang Lu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

We illustrated the reliability of longer wavelength ultraviolet light-emitting diodes (UVLEDs) in salty vapour environment under manipulation of forward-bias stress via consistent electrical and material characterizations. By manipulating the unprecedented operation in salty vapour ambient, we investigated a series of remarkable findings related to origin of failure behaviours.

Original languageEnglish
Title of host publication22nd Microoptics Conference, MOC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages306-307
Number of pages2
ISBN (Electronic)9784863486096
DOIs
StatePublished - 19 Nov 2017
Event22nd Microoptics Conference, MOC 2017 - Tokyo, Japan
Duration: 19 Nov 201722 Nov 2017

Publication series

Name22nd Microoptics Conference, MOC 2017
Volume2017-November

Conference

Conference22nd Microoptics Conference, MOC 2017
CountryJapan
CityTokyo
Period19/11/1722/11/17

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