Relative intensity noise characteristics of long-wavelength quantum dot vertical-cavity surface-emitting lasers

Peng Chun Peng*, Chao En Yeh, Hao-Chung Kuo, Rong Xuan, Chun-Ting Lin, Kuo-Jui Lin, Sien Chi, Jim Y. Chi

*Corresponding author for this work

Research output: Contribution to journalArticle

4 Scopus citations

Abstract

In the study we experimentally investigated the relative intensity noise (RIN) characteristics of a quantum-dot vertical-cavity surface-emitting laser (QD VCSEL). The single-mode QD VCSEL grown on a GaAs substrate is a fully doped structure. Additionally, the resonance frequency of the QD VCSEL with external light injection is as high as 19.2 GHz.

Original languageEnglish
Pages (from-to)6357-6358
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume47
Issue number8 PART 1
DOIs
StatePublished - 8 Aug 2008

Keywords

  • Quantum dots
  • Relative intensity noise
  • Vertical-cavity surface-emitting laser

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