Reflectance study of nano-scaled textured surfaces

G. Chung Chen*, Pei-Chen Yu, Hao-Chung Kuo

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

An algorithm based on rigorous coupled wave analysis is used to calculate the reflectance of two kinds of nano-scaled textured surfaces, periodic pyramid and random pillar structures. The device dimension and angular dependence are investigated.

Original languageEnglish
Title of host publication2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OMENS
Pages107-108
Number of pages2
DOIs
StatePublished - 1 Dec 2007
Event2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OMENS - Hualien, Taiwan
Duration: 12 Aug 200716 Aug 2007

Publication series

Name2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OMENS

Conference

Conference2007 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OMENS
CountryTaiwan
CityHualien
Period12/08/0716/08/07

Keywords

  • Anti-reflection
  • Nanostructure
  • ODR
  • Omni-directional reflector
  • SWS
  • Sub-wavelength structure

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