Recent experimental studies of electron dephasing in metal and semiconductor mesoscopic structures

Juhn-Jong Lin*, J. P. Bird

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

304 Scopus citations

Abstract

The results of the experimental study of the low-temperature electron dephasing time (τφ) in metals and semiconductor mesoscopic structures were presented. The experiment was performed to determine the value of τφ in systems of different dimentionality and with different levels of disorder. Results showed that the dephasing in metal films is mainly due to electron-phonon (e-ph) scattering and electron-electron scattering is the main cause of dephasing in semiconductor quantum wires.

Original languageEnglish
Pages (from-to)R501-R596
Number of pages96
JournalJournal of Physics Condensed Matter
Volume14
Issue number18
DOIs
StatePublished - 13 May 2002

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