Realizing a new pixel circuit design for alleviating oled degradation in a 2.4 inch amoled panel

Kuei Yu Lee; Jui Hsin Chang; Chang-Po Chao; Chiu Hao Chen; Zon Tim Tsai; Hong Shen Lin; Lee Hsun Chang; Yu Sin Lin

doi:10.1889/1.3621035

Realizing a new pixel circuit design for alleviating oled degradation in a 2.4 inch amoled panel

Kuei Yu Lee^*, Jui Hsin Chang, Chang-Po Chao, Chiu Hao Chen, Zon Tim Tsai, Hong Shen Lin, Lee Hsun Chang, Yu Sin Lin

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

This study proposes the pixel circuit of degradation alleviation realized in a 2.4 inch AMOLED panel. The panel is fabricated with the designs of panel supply signal and layout regulation. The OLED degradation measurements made possible by the newly-fabricated panel are recorded and show good performance.

Original language	English
Pages (from-to)	1173-1176
Number of pages	4
Journal	Digest of Technical Papers - SID International Symposium
Volume	42
Issue number	1
DOIs	https://doi.org/10.1889/1.3621035
State	Published - 1 Jun 2011
Event	49th Annual SID Symposium, Seminar, and Exhibition 2011, Display Week 2011 - Los Angeles, CA, United States Duration: 15 May 2011 → 20 May 2011

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title = "Realizing a new pixel circuit design for alleviating oled degradation in a 2.4 inch amoled panel",

abstract = "This study proposes the pixel circuit of degradation alleviation realized in a 2.4 inch AMOLED panel. The panel is fabricated with the designs of panel supply signal and layout regulation. The OLED degradation measurements made possible by the newly-fabricated panel are recorded and show good performance.",

author = "Lee, {Kuei Yu} and Chang, {Jui Hsin} and Chang-Po Chao and Chen, {Chiu Hao} and Tsai, {Zon Tim} and Lin, {Hong Shen} and Chang, {Lee Hsun} and Lin, {Yu Sin}",

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pages = "1173--1176",

journal = "Digest of Technical Papers - SID International Symposium",

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Realizing a new pixel circuit design for alleviating oled degradation in a 2.4 inch amoled panel. / Lee, Kuei Yu; Chang, Jui Hsin; Chao, Chang-Po; Chen, Chiu Hao; Tsai, Zon Tim; Lin, Hong Shen; Chang, Lee Hsun; Lin, Yu Sin.

In: Digest of Technical Papers - SID International Symposium, Vol. 42, No. 1, 01.06.2011, p. 1173-1176.

Research output: Contribution to journal › Article › peer-review

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AU - Lee, Kuei Yu

AU - Chang, Jui Hsin

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AU - Tsai, Zon Tim

AU - Lin, Hong Shen

AU - Chang, Lee Hsun

AU - Lin, Yu Sin

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