Random testing of interconnects in a boundary scan environment

Chau-Chin Su*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

In this paper, we propose a methodology for the random testing of interconnects with tri-state nets. A simple yet effective LFSR based impulse random test vector generator is designed to generate desired random vectors which will not activate multiple tri-state drivers with different values. The detail statistical analysis is conducted to derive two simple guidelines for the determination of test hardware configuration and the test length. The results show that the test length is compatible with the deterministic test methods.

Original languageEnglish
Title of host publicationProceedings of the European Design and Test Conference
Editors Anon
PublisherPubl by IEEE
Pages226-231
Number of pages6
ISBN (Print)0818654112
DOIs
StatePublished - 1 Jan 1994
EventProceedings of the European Design and Test Conference - Paris, Fr
Duration: 28 Feb 19943 Mar 1994

Publication series

NameProceedings of the European Design and Test Conference

Conference

ConferenceProceedings of the European Design and Test Conference
CityParis, Fr
Period28/02/943/03/94

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