Product-mix decision in a mixed-yield wafer fabrication scenario

Muh-Cherng Wu*, W. J. Chang, C. W. Chiou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

The product mix decision problem for semiconductor manufacturing has been extensively studied in literature. However, most of them are based on a high-yield scenario. Yet, in a low-yield manufacturing environment, some research claims that scrap low-yield lots in an early stage may produce more profit. Considering the early scrapping characteristics, this paper aims to solve the product mix decision problem for a mixed-yield scenario, which involves the simultaneous production of high-yield and low-yield products. A nonlinear mathematical program is developed to model the decision problem. Two methods for solving the nonlinear program are proposed. Method 1 converts the nonlinear program into a linear program by setting some variables as parameters. The method provides an optimal solution by exhaustively searching these parameterized variables and solving the LP models iteratively. Method 2 aims to reduce the computation complexity while providing a near optimal solution. Experiment results show that method 2 is better than method 1, when aggregately considering solution quality and computation efforts.

Original languageEnglish
Pages (from-to)746-752
Number of pages7
JournalInternational Journal of Advanced Manufacturing Technology
Volume29
Issue number7-8
DOIs
StatePublished - 1 Jul 2006

Keywords

  • Mixed-yield scenario
  • Product mix planning
  • Scrapping

Fingerprint Dive into the research topics of 'Product-mix decision in a mixed-yield wafer fabrication scenario'. Together they form a unique fingerprint.

Cite this