Process selection for higher production yield based on capability index Spk

Chen Ju Lin*, W.l. Pearn

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

Process selection is the problem of comparing two processes and selecting the one that has a higher capability value. In this paper, we consider the process selection problem by using the yield index Spk to compare two production processes and select one that has higher production yield. An analytical exact approach is proposed to solve this problem. Testing hypotheses with two phases for comparing two processes are developed. Critical values of the test are obtained to determine the selection decisions. Sample sizes required for designated selection power and confidence level are also investigated. The results provide useful information to practitioners. An application example on comparing two thin-film transistor (TFT) type liquid-crystal display (LCD) production processes is presented to illustrate the practicality of the proposed approach to a real problem in the factory.

Original languageEnglish
Pages (from-to)247-258
Number of pages12
JournalQuality and Reliability Engineering International
Volume26
Issue number3
DOIs
StatePublished - 1 Apr 2010

Keywords

  • Non-conformities
  • Process capability index
  • Process selection
  • Production yield

Fingerprint Dive into the research topics of 'Process selection for higher production yield based on capability index S<sub>pk</sub>'. Together they form a unique fingerprint.

Cite this