Probing mobility gaps at resistivity minima in the integer quantum Hall effect

C. T. Liang*, K. Y. Chen, Jau Yang Wu, Sheng-Di Lin, Li Hung Lin, Yu Ru Li, Shung Tseng Yen, Chun Kai Yang, Po Tsun Lin, K. A. Cheng, C. F. Huang

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Magneto-transport measurements are performed on the AlGaAs/GaAs quantum Hall (QH) devices fabricated recently by our group. A series of Hall plateaus are observed with increasing the perpendicular magnetic field, and the mobility gaps resulting from localization effects are investigated at the minima in the longitudinal resistivity. Only the gap corresponding to the filling factor i=2 is close to the expected cyclotron energy, and our study supports that the low-field QH conductors may suffer problems due to insufficient localization. The anomalous change on the Hall slope is observed when the i=3 plateau is destroyed by the large current.

Original languageEnglish
Title of host publication2008 Conference on Precision Electromagnetic Measurements Digest, CPEM 2008
Pages398-399
Number of pages2
DOIs
StatePublished - 23 Sep 2008
Event2008 Conference on Precision Electromagnetic Measurements Digest, CPEM 2008 - Broomfield, CO, United States
Duration: 8 Jun 200813 Jun 2008

Publication series

NameCPEM Digest (Conference on Precision Electromagnetic Measurements)
ISSN (Print)0589-1485

Conference

Conference2008 Conference on Precision Electromagnetic Measurements Digest, CPEM 2008
CountryUnited States
CityBroomfield, CO
Period8/06/0813/06/08

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    Liang, C. T., Chen, K. Y., Wu, J. Y., Lin, S-D., Lin, L. H., Li, Y. R., Yen, S. T., Yang, C. K., Lin, P. T., Cheng, K. A., & Huang, C. F. (2008). Probing mobility gaps at resistivity minima in the integer quantum Hall effect. In 2008 Conference on Precision Electromagnetic Measurements Digest, CPEM 2008 (pp. 398-399). [4574821] (CPEM Digest (Conference on Precision Electromagnetic Measurements)). https://doi.org/10.1109/CPEM.2008.4574821