Preface of Special Issue on VLSI Design and Test

Laurence T. Yang*, Jose G. Delgado-Frias, Yiming Li, Mohammed Niamat, Dimitrios Soudris, Srinivasa R. Vemuru

*Corresponding author for this work

Research output: Contribution to journalEditorial

Abstract

The recent important advances in the area of VLSI design tests done in Asia Pacific, Europe, and North America, were submitted in the form of research papers at the International VLSI Conference, 2003. The research submissions were selected for best papers after a review of the relevance and technical contents. The excellent and interesting articles were selected for presentations. Thirteen papers were selected in the conference that included subjects and special issues in the VLSI studies. The selected papers and topics covered the areas of nano-scale devices and systems-on-chip, provide newer ideas, results, progress, and state-of-art techniques, and simulate further research in the area of VLSI design and tests. The VLSI and Electronic Design Automation is facing various challenges in design methods, design tools, design automation, manufacturing, technology, and test procedures.

Original languageEnglish
Pages (from-to)193
Number of pages1
JournalMicroelectronic Engineering
Volume84
Issue number2
DOIs
StatePublished - Feb 2007

Fingerprint Dive into the research topics of 'Preface of Special Issue on VLSI Design and Test'. Together they form a unique fingerprint.

  • Cite this

    Yang, L. T., Delgado-Frias, J. G., Li, Y., Niamat, M., Soudris, D., & Vemuru, S. R. (2007). Preface of Special Issue on VLSI Design and Test. Microelectronic Engineering, 84(2), 193. https://doi.org/10.1016/j.mee.2006.12.005