Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis

Jin Jung Chyou*, Chih Sheng Chu, Fan Ching Chien, Chun Yu Lin, Tse Liang Yeh, Roy Chaoming Hsu, Shean Jen Chen

*Corresponding author for this work

Research output: Contribution to journalArticle

6 Scopus citations

Abstract

Surface plasmon resonance (SPR) sensing and an enhanced data analysis technique are used to obtain precise predictions of the dielectric constant and thickness of a nanolayer. In the proposed approach, a modified analytical method is used to obtain initial estimates of the dielectric constants and thicknesses of the metal film and a nanolayer on the sensing surface of a SPR sensor. A multiexperiment data analysis approach based on a two-solvent SPR method is then employed to improve the initial estimates by suppressing the noise in the measurement data. The proposed two-stage approach is employed to determine the dielectric constant and thickness of a molecular imprinting polymer nanolayer. It is found that the results are in good agreement with those obtained with an ellipsometer and a high-resolution scanning electron microscope.

Original languageEnglish
Pages (from-to)6038-6044
Number of pages7
JournalApplied Optics
Volume45
Issue number23
DOIs
StatePublished - 10 Aug 2006

Fingerprint Dive into the research topics of 'Precise determination of the dielectric constant and thickness of a nanolayer by use of surface plasmon resonance sensing and multiexperiment linear data analysis'. Together they form a unique fingerprint.

  • Cite this