Postfitting control scheme for periodic piezoscanner driving

Shao-Kang Hung, En Te Hwu, Ing Shouh Hwang*, Li Chen Fu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations


The hysteresis and other nonlinear properties of piezoelectric scanners cause image distortion in scanning probe microscopy (SPM). Two types of control algorithm, feedback and feedforward, were applied to solve this problem. In general, a feedforward control method has a higher scanning speed, a higher resolution, but a lower accuracy than a feedback control method. In this paper, we propose a postfitting control scheme for driving the x-scanner of SPM periodically. This method possesses the advantages of both the feedback and feedforward methods, and achieves a higher image resolution and a higher accuracy than a pure feedback or feedforward method, without sacrificing scanning speed.

Original languageEnglish
Pages (from-to)1917-1921
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Issue number3 B
StatePublished - 27 Mar 2006


  • Feedback control
  • Feedforward control
  • Hysteresis
  • Piezoelectric nonlinearity
  • Scanning probe microscopy

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