Polarization degradation and breakdown of pulse-laser-deposited (Pb,Sr)TiO3 films at low temperatures

Jyh Liang Wang*, Der Chi Shye, Yi Sheng Lai, Huai Yuan Tseng, Chuan Ping Juan, Chun Chien Tsai, Huang-Chung Cheng

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

(Pb,Sr)TiO3 (PST) films were deposited on Pt/SiO2/Si by pulsed laser deposition at low substrate temperatures (Ts) ranging from 300 to 450°C. The loss in remnant polarization (Pr) and coercive field (Ec) is found to be less than 17% after 10 10 switching cycles when Ts is higher than 350°C. It is also suggested that the leakage current is reduced when Ts increases up to a temperature of 400°C. However, PST films deposited at 450°C may produce serious Pb-O volatilization, resulting in the deterioration of the crystallinity and high leakage currents. As a result, the 400°C-deposited PST film reveals the lowest leakage current, nearly fatigued-free J-E characteristics after 1010 switching cycles, and the best breakdown property, attributed to the enhanced crystallinity and low concentration of defects.

Original languageEnglish
Pages (from-to)267-271
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume46
Issue number1
DOIs
StatePublished - 10 Jan 2007

Keywords

  • Breakdown
  • Deposition temperature (substrate temperature)
  • Fatigue
  • Ferroelectric
  • Lead strontium titanate
  • Pulsed-laser deposition

Fingerprint Dive into the research topics of 'Polarization degradation and breakdown of pulse-laser-deposited (Pb,Sr)TiO<sub>3</sub> films at low temperatures'. Together they form a unique fingerprint.

  • Cite this