Piezoresponse force microscopy imaging and its correlation with cantilever spring constant and frequency

O. Solis Canto, E. A. Murillo-Bracamontes, J. J. Gervacio-Arciniega, M. Toledo-Solano, G. Torres-Miranda, E. Cruz-Valeriano, Ying-hao Chu, M. A. Palomino-Ovando, C. I. Enriquez-Flores, M. E. Mendoza, H'Linh Hmok*, M. P. Cruz

*Corresponding author for this work

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Single-frequency piezoresponse force microscopy (PFM) images of a BiFeO3/DyScO3(110) thin film, obtained with long (k(c)=0.82N/m) and short (k(c)=7.64N/m) cantilevers, were analyzed as a function of the applied voltage frequency. For long cantilevers, the electrostatic and electrostrictive contributions were identified. These contributions were reduced with a frequency near the second mode of the contact resonance; while for short cantilevers, the first mode was necessary. A method for domain structure analyses, to discriminate a ferroelectric behavior from a non-ferroelectric, through the optimization of PFM images, is also described. The analysis can be extended to cantilevers with different spring constants and ferroelectric materials.

Original languageEnglish
Article number084101
Number of pages9
JournalJournal of Applied Physics
Issue number8
StatePublished - 28 Aug 2020

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