Photoluminescence characterization of the interface properties of si nanolayers and nanowires

Y. Sakurai, K. Ohmori, K. Yamada, K. Shiraishi, K. Kakushima, H. Iwai, S. Nomura

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present results of the photoluminescence (PL) measurements of silicon nanowires (NWs) and silicon nanolayers for device characterization.

Original languageEnglish
Title of host publicationSolid State Topics (General) - 220th ECS Meeting
Pages47-50
Number of pages4
Edition34
DOIs
StatePublished - 2012
EventSolid State Topics General Session - 220th ECS Meeting - Boston, MA, United States
Duration: 9 Oct 201114 Oct 2011

Publication series

NameECS Transactions
Number34
Volume41
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

ConferenceSolid State Topics General Session - 220th ECS Meeting
CountryUnited States
CityBoston, MA
Period9/10/1114/10/11

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