Photo-detection characteristics of In-Zn-O/SiO x /n-Si hetero-junctions

Hau Wei Fang, Tsung-Eong Hsien*, Jenh-Yih Juang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations


A layer of indium zinc oxide (IZO) was deposited on the n-type Si substrate clad with a thin thermally grown SiO x layer by pulsed laser deposition to form the semiconductor-insulator-semiconductor (SIS) hetero-junction which exhibits substantial photo-induced responses. Investigation on the IZO layer deposited at various temperatures indicated that IZO film grown at 250 °C possesses a resistivity of 4.9 × 10 -4 Ω cm with the transmittance exceeding 80% in the wavelength range between near infrared to ultraviolet light. The photodetection device made of the SIS hetero-junction structure was found to exhibit the photoresponse (R) of 35 AW -1 and 6.15 AW -1 with a quick photo-response time less than 80 ms under the illumination of visible light and ultraviolet light, respectively. The underlying mechanism for such a unique characteristic was attributed to the suppression of majority carrier tunneling resulted from the Schottky barrier established at the SIS interfaces.

Original languageEnglish
Pages (from-to)295-300
Number of pages6
JournalApplied Surface Science
StatePublished - 1 Jan 2015


  • Indium zinc oxide
  • Photodetector
  • Pulsed laser deposition
  • Semiconductor-insulator-semiconductor hetero-junction structure

Fingerprint Dive into the research topics of 'Photo-detection characteristics of In-Zn-O/SiO <sub>x</sub> /n-Si hetero-junctions'. Together they form a unique fingerprint.

Cite this