Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

Chun I. Chuang, Vera Marinova, Shiuan-Huei Lin, Yu Faye Chao*

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

Original languageEnglish
Pages (from-to)2867-2869
Number of pages3
JournalThin Solid Films
Volume519
Issue number9
DOIs
StatePublished - 28 Feb 2011

Keywords

  • Curie region
  • Ellipsometry
  • Perovskite
  • Refractive index

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