Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

Chun I. Chuang; Vera Marinova; Shiuan-Huei Lin; Yu Faye Chao

doi:10.1016/j.tsf.2010.12.085

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

Chun I. Chuang, Vera Marinova, Shiuan-Huei Lin, Yu Faye Chao^*

^*Corresponding author for this work

Department of Electrophysics

Research output: Contribution to journal › Article › peer-review

Abstract

Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn_1/3Nb _2/3)O₃ (PZN)-0.1PbTiO₃ (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

Original language	English
Pages (from-to)	2867-2869
Number of pages	3
Journal	Thin Solid Films
Volume	519
Issue number	9
DOIs	https://doi.org/10.1016/j.tsf.2010.12.085
State	Published - 28 Feb 2011

Keywords

Curie region
Ellipsometry
Perovskite
Refractive index

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title = "Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal",

abstract = "Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.",

keywords = "Curie region, Ellipsometry, Perovskite, Refractive index",

author = "Chuang, {Chun I.} and Vera Marinova and Shiuan-Huei Lin and Chao, {Yu Faye}",

year = "2011",

month = feb,

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doi = "10.1016/j.tsf.2010.12.085",

language = "English",

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journal = "Thin Solid Films",

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T1 - Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

AU - Chuang, Chun I.

AU - Marinova, Vera

AU - Lin, Shiuan-Huei

AU - Chao, Yu Faye

PY - 2011/2/28

Y1 - 2011/2/28

N2 - Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

AB - Phase-modulated ellipsometry was applied to measure changes in the refractive index of pure and ruthenium (Ru)-doped 0.9Pb (Zn1/3Nb 2/3)O3 (PZN)-0.1PbTiO3 (PT) during the heating process in real time. Both samples were heated from room temperature to 200 °C in a thermally insulated chamber. In both samples, the phase transitions were observed to change from tetragonal to cubic. The temperature region at which the phase transition (Curie region) of Ru-doped 0.9PZN-0.1PT occurred not only broadened but also shifted to a lower temperature. The refractive indices were extremely stable in this region, meaning that Ru-doped 0.9PZN-0.1PT is a more favorable medium for the fabrication of optical memories.

KW - Curie region

KW - Ellipsometry

KW - Perovskite

KW - Refractive index

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DO - 10.1016/j.tsf.2010.12.085

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VL - 519

SP - 2867

EP - 2869

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 9

ER -

Phase-modulated ellipsometry for probing the temperature-induced phase transition in ruthenium-doped lead zinc niobate-lead titanate single crystal

Abstract

Keywords

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