Performances and reliability of 850 nm VCSELs with various offset in gain peak and Fabry-Perot dip

Fang I. Lai, Li Hong Laih, T. H. Hsueh, S. P. Tseng, Hao-Chung Kuo, S. C. Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The 850 nm VCSELs with various wavelength offsets in gain peak and Fabry-Perot dip were designed and fabricated. The VCSEL with 10 nm offset has the threshold current with less temperature sensitivity and the best reliability.

Original languageEnglish
Title of host publicationCLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics
Subtitle of host publicationPhotonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (Electronic)0780377664
DOIs
StatePublished - 1 Jan 2003
Event5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003 - Taipei, Taiwan
Duration: 15 Dec 200319 Dec 2003

Publication series

NamePacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest
Volume2

Conference

Conference5th Pacific Rim Conference on Lasers and Electro-Optics, CLEO/Pacific Rim 2003
CountryTaiwan
CityTaipei
Period15/12/0319/12/03

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    Lai, F. I., Laih, L. H., Hsueh, T. H., Tseng, S. P., Kuo, H-C., & Wang, S. C. (2003). Performances and reliability of 850 nm VCSELs with various offset in gain peak and Fabry-Perot dip. In CLEO/Pacific Rim 2003 - 5th Pacific Rim Conference on Lasers and Electro-Optics: Photonics Lights Innovation, from Nano-Structures and Devices to Systems and Networks, Proceedings [1277058] (Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest; Vol. 2). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CLEOPR.2003.1277058