Pattern selection for testing of deep sub-micron timing defects

Mango*, Chia-Tso Chao, Li C. Wang, Kwang Ting Cheng

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations

Abstract

Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating the test quality with respect to timing defects under process variations. Based on the proposed metric and a dynamic timing analyzer, we develop a pattern-selection algorithm for selecting the minimal number of patterns that can achieve the maximal test quality. To shorten the run time in dynamic timing analysis, we propose an algorithm to speed up the Monte-Carlo-based simulation. Our experimental results show that, selecting a small percentage of patterns from a multiple-detection transition fault pattern set is sufficient to maintain the test quality given by the entire pattern set. We present run-time and accuracy comparisons to demonstrate the efficiency and effectiveness of our pattern selection framework.

Original languageEnglish
Title of host publicationProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
EditorsG. Gielen, J. Figueras
Pages1060-1065
Number of pages6
DOIs
StatePublished - 12 Jul 2004
EventProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04 - Paris, France
Duration: 16 Feb 200420 Feb 2004

Publication series

NameProceedings - Design, Automation and Test in Europe Conference and Exhibition
Volume2

Conference

ConferenceProceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04
CountryFrance
CityParis
Period16/02/0420/02/04

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  • Cite this

    Mango, Chao, C-T., Wang, L. C., & Cheng, K. T. (2004). Pattern selection for testing of deep sub-micron timing defects. In G. Gielen, & J. Figueras (Eds.), Proceedings - Design, Automation and Test in Europe Conference and Exhibition, DATE 04 (pp. 1060-1065). (Proceedings - Design, Automation and Test in Europe Conference and Exhibition; Vol. 2). https://doi.org/10.1109/DATE.2004.1269033