Optimal Diagnosis Procedures for k-out-of-n Structures

Ming-Feng Chang, Weiping Shi, W. Kent Fuchs

Research output: Contribution to journalArticlepeer-review

20 Scopus citations


This paper investigates diagnosis strategies for repairable VLSI and WSI structures based on integrated diagnosis and repair. Knowledge of the repair strategy, the probability of each unit being good, and the expected test time of each unit is used by the diagnosis algorithm to select units for testing. The general problem is described followed by an examination of a specific case. For k-out-of-n structures, we give a complete proof for the optimal diagnosis procedure proposed by Ben-Dov. A compact representation of the optimal diagnosis procedure is described, which requires O(n2) space and can be generated in O(n2) time. Simulation results are provided to show the improvement in diagnosis time over on-line repair and off-line repair.

Original languageEnglish
Pages (from-to)559-564
Number of pages6
JournalIEEE Transactions on Computers
Issue number4
StatePublished - 1 Jan 1990


  • Diagnosis
  • K-out-of-n
  • repair
  • VLSI
  • wafer probe testing
  • WSI

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