Online RF self-measurement for high-reliability wireless modem

Shao Ying Yeh*, Terng-Yin Hsu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

RF self-measurement is an important procedure when the system started up to ensure wireless transceiver reliably. We propose an online RF self-measurement in Xilinx Zynq (Zedboard) with RF (AD-FMCOMMS1-EBZ) to measure the radio frequency (RF) quality, in terms of Bit Error Rate (BER), Image Rejection Ratio (IRR), Signal-to-Noise Ratio (SNR), Error Vector Magnitude (EVM) and Noise Figure (NF). The measured results match theoretical simulations.

Original languageEnglish
Title of host publication5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015
EditorsJose Maria Flores-Arias, Stefan Mozar, Dietmar Hepper, Milan Z. Bjelica, Hans L. Cycon
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages428-430
Number of pages3
ISBN (Electronic)9781479987481
DOIs
StatePublished - 25 Jan 2016
Event5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 - Berlin, Germany
Duration: 6 Sep 20159 Sep 2015

Publication series

Name5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015

Conference

Conference5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015
CountryGermany
CityBerlin
Period6/09/159/09/15

Keywords

  • BER
  • IRR
  • NF
  • Self-measurement
  • SNR

Fingerprint Dive into the research topics of 'Online RF self-measurement for high-reliability wireless modem'. Together they form a unique fingerprint.

  • Cite this

    Yeh, S. Y., & Hsu, T-Y. (2016). Online RF self-measurement for high-reliability wireless modem. In J. M. Flores-Arias, S. Mozar, D. Hepper, M. Z. Bjelica, & H. L. Cycon (Eds.), 5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015 (pp. 428-430). [7391298] (5th IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2015). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-Berlin.2015.7391298