One-sided process capability assessment in the presence of measurement errors

W.l. Pearn*, Mou Yuan Liao

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

In the manufacturing industry, many product characteristics are of one-sided specifications. The well-known process capability indices CPU and CPL are often used to measure process performance. Most capability research works have assumed no measurement errors. Unfortunately, such an assumption is not realistic even if the measurement is conducted using highly sophisticated advanced measuring instruments. Therefore, conclusions drawn regarding process capability are not reliable. In this paper, we consider the estimation and testing of CPU and CPL with the presence of measurement errors, to obtain adjusted lower confidence bounds and critical values for true process capability, which can be used to determine whether the factory processes meet the capability requirement when the measurement errors are unavoidable.

Original languageEnglish
Pages (from-to)771-785
Number of pages15
JournalQuality and Reliability Engineering International
Volume22
Issue number7
DOIs
StatePublished - 1 Nov 2006

Keywords

  • Confidence bound
  • Critical value
  • Gauge measurement errors
  • Onesided specification
  • Process capability indices

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