This brief demonstrates that, through the perspective of body-source built-in potential lowering (Vbi), the geometry-dependent floating-body effect in state-of-the-art silicon-on-insulator (SOI) MOSFETs can be explained and predicted by the geometry dependence of threshold voltage (VT). The correlation between Vbi and VT unveiled in this brief is the underlying mechanism responsible for the coexistence of partially depleted and fully depleted devices in a single SOI chip.
- Body-source built-in potential lowering
- Floating-body effect
- Fully depleted (FD)
- Partially depleted (PD)
- Silicon-on-insulator (SOl) CMOS
- Threshold voltage