This letter provides a viewpoint for the characterization of state-of-the-art thin film sllicon-on-insulator (SOI) MOSFETs. Based on body - source built-in potential lowering, the degree of full depletion can be quantified. In addition to serving as a measure of the floating-body behavior of SOI devices, the concept also enables the consolidation of partial-depletion (PD) and full-depletion (FD) SOI compact models. This consolidation of compact models together with the trend of coexistence of PD/FD devices in a single chip has become one of the greatest challenges in the scaling of SOI CMOS.
- Body-source built-in potential lowering
- Floating-body effect
- Impact ionization
- Silicon-film-thickness scaling
- SOI CMOS