On-chip statistical hot-spot estimation using mixed-mesh statistical polynomial expression generating and skew-normal based moment matching techniques

Pei Yu Huang*, Yu-Min Lee, Chi Wen Pan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This work introduces the concept of thermal yield profile for the hot-spot identification with considering process variations and provides an efficient estimating technique for the thermal yield profile. After executing a mixed-mesh strategy for generating statistical polynomial expression of the on-chip temperature distribution, the thermal yield profile is obtained by a skew-normal based moment matching technique. Comparing with the Monte Carlo method, experimental results demonstrate that our method can efficiently and accurately estimate the thermal yield profile. With the same level of accuracy, our skew-normal based method achieves 215x speedup over the state of the art, APEX [1], for estimating the thermal yield profile. Moreover, results show that our mixed-mesh statistical polynomial expression generator achieves 130x speedup over the statistical collocation based method [2] and still accurately estimates the thermal yield profile.

Original languageEnglish
Title of host publicationASP-DAC 2012 - 17th Asia and South Pacific Design Automation Conference
Pages603-608
Number of pages6
DOIs
StatePublished - 26 Apr 2012
Event17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012 - Sydney, NSW, Australia
Duration: 30 Jan 20122 Feb 2012

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012
CountryAustralia
CitySydney, NSW
Period30/01/122/02/12

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