On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbance

Cheng Cheng Yen*, Ming-Dou Ker, Wan Yen Lin, Che Ming Yang, Shih Fan Chen, Tung Yang Chen

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

A new on-chip detection circuit is proposed for electrical fast transient (EFT) protection design in a display system. For microelectronic products, electrical transient disturbances often cause upset or frozen states under the IEC test standard. The output signal of the proposed detection circuit can be used as a firmware index to execute system automatic recovery operations and to release the EFT-induced locked states in display panels. The circuit function to detect positive or negative electrical transients has been investigated in HSPICE simulation and verified in silicon chip. The experimental results have confirmed successful circuit performance under EFT tests. With hardware/firmware co-design, the immunity of a display system against electrical transient disturbance has been significantly improved.

Original languageEnglish
Article number012053
JournalJournal of Physics: Conference Series
Volume301
Issue number1
DOIs
StatePublished - 1 Jan 2011

Fingerprint Dive into the research topics of 'On-chip detection circuit for protection design in display panel against electrical fast transient (EFT) disturbance'. Together they form a unique fingerprint.

  • Cite this