On-chip analog response extraction with 1-bit Σ-Δ Modulators

Hao-Chiao Hong, Jiun Lang Huang, Kwang Ting Cheng, Cheng Wen Wu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

Abstract

Because of their relative robustness to process variation, Σ-Δ modulation techniques are particularly suitable for VLSI implementations. In this paper, we propose to employ the 1-bit Σ-Δ modulation ADC (analog-to-digital converter) as the on-chip analog response extractor for analog/mixed-signal BIST (built-in self-test) applications. To validate the idea, a prototype chip with the proposed BIST circuitry has been designed and fabricated. Performance of the BIST circuitry is validated (up to 87 dB dynamic range), and measurement results of the circuit under test (CUT), a 2nd-order low-pass filter, are presented.

Original languageEnglish
Title of host publicationProceedings of the 11th Asian Test Symposium, ATS 2002
PublisherIEEE Computer Society
Pages49-54
Number of pages6
ISBN (Electronic)0769518257, 0769518257
DOIs
StatePublished - 1 Jan 2002
Event11th Asian Test Symposium, ATS 2002 - Guam, United States
Duration: 18 Nov 200220 Nov 2002

Publication series

NameProceedings of the Asian Test Symposium
Volume2002-January
ISSN (Print)1081-7735

Conference

Conference11th Asian Test Symposium, ATS 2002
CountryUnited States
CityGuam
Period18/11/0220/11/02

Keywords

  • Built-in self-test
  • Circuit testing
  • Delta modulation
  • Digital modulation
  • Distortion measurement
  • Frequency measurement
  • Performance evaluation
  • Robustness
  • Signal resolution
  • System testing

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