The current-voltage characteristics (IVC) of Tl-based superconducting thin films as well as the magnetization of the Tl-based bulk sample were investigated. A crossover similar to the prediction of the vortex-glass to vortex-liquid phase transition in the IVC of Tl-based superconducting thin films was clearly demonstrated. More significantly, striking scaling behavior was found in the IVC which is only sample dependent and is irrelevant to the applied magnetic fields. By comparison to dc magnetization measurements on similar bulk samples, it is found that the phase boundary is not the irreversibility line commonly encountered in the flux-creep scenario.
- Flux creep
- Irreversibility line
- Tl-based superconducting thin film
- Vortex-glass to vortex-liquid transition