Observation of the vortex-glass transition in the Tl-based superconducting thin films

Chungyung Wang*, Hung Lun Chang, Jenh-Yih Juang, Yih Shun Gou, Tzeng Ming Uen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

The current-voltage characteristics (IVC) of Tl-based superconducting thin films as well as the magnetization of the Tl-based bulk sample were investigated. A crossover similar to the prediction of the vortex-glass to vortex-liquid phase transition in the IVC of Tl-based superconducting thin films was clearly demonstrated. More significantly, striking scaling behavior was found in the IVC which is only sample dependent and is irrelevant to the applied magnetic fields. By comparison to dc magnetization measurements on similar bulk samples, it is found that the phase boundary is not the irreversibility line commonly encountered in the flux-creep scenario.

Original languageEnglish
Pages (from-to)L1054-L1057
JournalJapanese Journal of Applied Physics
Volume31
Issue number8
DOIs
StatePublished - 1 Jan 1992

Keywords

  • Flux creep
  • Irreversibility line
  • Tl-based superconducting thin film
  • Vortex-glass to vortex-liquid transition

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