Observation of dislocation etch pits in epitaxial lateral overgrowth GaN by wet chemical etching

T. C. Wen*, S. C. Lee, H. S. Chuang, C. H. Chiou, Wei-I Lee

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Fingerprint Dive into the research topics of 'Observation of dislocation etch pits in epitaxial lateral overgrowth GaN by wet chemical etching'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy