NOVEL MEASUREMENTS OF ELECTRIC FIELD ENHANCED CARRIER EMISSION OF DEFECTS IN SILICON.

Z. F. Guan*, G. P. Li, K. L. Wang, Mau-Chung Chang

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

1 Scopus citations
Original languageEnglish
Pages491-498
Number of pages8
StatePublished - 1 Dec 1983

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