Abstract
The compositionally graded Ba1-xSrxTiO3 films with a fine compositional gradient from BaTiO3 to Ba 0.70Sr0.30TiO3, were fabricated on LaNiO 3 buffered Pt-Ti-SiO2-Si substrates, by sol-gel method. The gradient distribution of Ba and Sr species from the surface of the film to the substrate was confirmed by x-ray photoelectron spectroscopy analysis. Dielectric constant and dielectric loss showed negligible temperature dependence. The results show that factors like composition gradient, direct current bias voltage and frequency of the applied voltage can be manipulated to produce optimum dielectric properties.
Original language | English |
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Pages (from-to) | 1162-1164 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 84 |
Issue number | 7 |
DOIs | |
State | Published - 16 Feb 2004 |