New transient detection circuit for Electrical Fast Transient (EFT) protection design in display panels

Ming-Dou Ker*, Wan Yen Lin, Cheng Cheng Yen, Che Ming Yang, Tung Yang Chen, Shih Fan Chen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

A new transient detection circuit against electrical fast transient (EFT) disturbance is proposed for display panel protection. The circuit function to detect positive or negative electrical transients under EFT tests has been investigated in HSPICE simulation and verified in silicon chip. The output of the proposed transient detection circuit can be used as a firmware index to execute system automatic recovery operation. With hardware/firmware co-design, the immunity of display panel against transient disturbance under EFT tests can be significantly improved.

Original languageEnglish
Title of host publication2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
Pages51-54
Number of pages4
DOIs
StatePublished - 20 Aug 2010
Event2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010 - Grenoble, France
Duration: 2 Jun 20104 Jun 2010

Publication series

Name2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010

Conference

Conference2010 IEEE International Conference on Integrated Circuit Design and Technology, ICICDT 2010
CountryFrance
CityGrenoble
Period2/06/104/06/10

Keywords

  • Electrical fast transient (EFT) test
  • Electromagnetic compatibility
  • Transient detection circuit

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