New Physical Formulation of the Thermionic Emission Current at the Heterojunction Interface

Kow-Ming Chang, Jung Yu Tsai, Chun Yen Chang

Research output: Contribution to journalArticle

7 Scopus citations

Abstract

The thermionic emission current for electrons across the heterointerface is classically modeled as the difference between two opposing electron fluxes. Here we have developed a new consistent physical model, which includes the carrier degeneracy and nonideal behavior effects, for thermionic emission current at the heterojunction interface. It is shown that the thermionic emission current at the heterojunction interface can be expressed in a simple closed-form formalism which gives the relations among the average directional thermal velocity of electrons, the conduction band discontinuity, and the carrier activities at both sides of the interface. We also discuss the conditions under which the thermionic emission occurs at the heterointerface.

Original languageEnglish
Pages (from-to)338-341
Number of pages4
JournalIEEE Electron Device Letters
Volume14
Issue number7
DOIs
StatePublished - 1 Jan 1993

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