New on-chip transient detection circuit to improve electromagnetic susceptibility of microelectronic systems

Xiao Rui Kang, Ming-Dou Ker

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

A new on-chip transient detection circuit for system-level electrostatic discharge (ESD) protection is presented in this work. The circuit simulation and experimental results with silicon testchip in a 0.18-um CMOS process have confirmed that the new proposed circuit can successfully detect the occurrence of system-level ESD-induced electrical transient disturbance. The detection output can be used as system recovery index to restore the system from frozen or upset state to a stable and known state. Therefore, the immunity of microelectronic products against the system-level ESD test can be effectively enhanced.

Original languageEnglish
Title of host publicationEDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-2
Number of pages2
ISBN (Electronic)9781538629079
DOIs
StatePublished - 1 Dec 2017
Event13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 - Hsinchu, Taiwan
Duration: 18 Oct 201720 Oct 2017

Publication series

NameEDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
Volume2017-January

Conference

Conference13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017
CountryTaiwan
CityHsinchu
Period18/10/1720/10/17

Keywords

  • Electromagnetic susceptibility (EMS)
  • Electrostatic discharge (ESD)
  • System-level ESD
  • Transient detection circuit

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