New observations on the uniaxial and biaxial strain-induced hot carrier and NBTI reliabilities for 65nm node CMOS devices and beyond

Steve S. Chung, D. C. Huang, Y. J. Tsai, C. S. Lai, C. H. Tsai, P. W. Liu, Y. H. Lin, C. T. Tsai, G. H. Ma, S. C. Chien, S. W. Sun

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Scopus citations

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Chemical Compounds

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Physics & Astronomy