New design of transient-noise detection circuit with SCR device for system-level ESD protection

Ming-Dou Ker*, Wan Yen Lin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A new SCR-based transient detection circuit for on-chip protection design against system-level ESD-induced electrical transient disturbance is proposed and verified in silicon chip. The experimental results in a 0.18-μm CMOS process have confirmed that the new proposed detection circuit can successfully memorize the occurrence of system-level ESD-induced electrical transient events. The detection output can be cooperated with firmware operation to automatically execute system recovery procedure, therefore the immunity of microelectronic systems against system-level ESD test can be effectively improved.

Original languageEnglish
Title of host publication2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
Pages81-84
Number of pages4
DOIs
StatePublished - 7 Nov 2012
Event2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012 - Montreal, QC, Canada
Duration: 17 Jun 201220 Jun 2012

Publication series

Name2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012

Conference

Conference2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012
CountryCanada
CityMontreal, QC
Period17/06/1220/06/12

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    Ker, M-D., & Lin, W. Y. (2012). New design of transient-noise detection circuit with SCR device for system-level ESD protection. In 2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012 (pp. 81-84). [6328961] (2012 IEEE 10th International New Circuits and Systems Conference, NEWCAS 2012). https://doi.org/10.1109/NEWCAS.2012.6328961