NBTI and leakage reduction using ILP-based approach

Ing Chao Lin; Kuan Hui Li; Chia Hao Lin; Kai-Chiang Wu

doi:10.1109/TVLSI.2013.2280651

NBTI and leakage reduction using ILP-based approach

Ing Chao Lin, Kuan Hui Li, Chia Hao Lin, Kai-Chiang Wu

Department of Computer Science

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

We propose an integer linear programming-based formulation to improve the effectiveness of the transmission gate-based technique intended to reduce negative-bias temperature instability and leakage power consumption. We also propose a virtual input pin technique to improve leakage reduction and use path sensitization to reduce area overhead. Simulation results show that combining these techniques can achieve >51.18% delay improvement and 63.34% leakage power improvement with only 2.31% area overhead.

Original language	English
Article number	6607241
Pages (from-to)	2034-2038
Number of pages	5
Journal	IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume	22
Issue number	9
DOIs	https://doi.org/10.1109/TVLSI.2013.2280651
State	Published - 1 Jan 2014

Keywords

Aging mitigation
Integer linear programming (ILP)
Leakage reduction
Negative-bias temperature instability (NBTI)
Virtual pin

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10.1109/TVLSI.2013.2280651

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abstract = "We propose an integer linear programming-based formulation to improve the effectiveness of the transmission gate-based technique intended to reduce negative-bias temperature instability and leakage power consumption. We also propose a virtual input pin technique to improve leakage reduction and use path sensitization to reduce area overhead. Simulation results show that combining these techniques can achieve >51.18% delay improvement and 63.34% leakage power improvement with only 2.31% area overhead.",

keywords = "Aging mitigation, Integer linear programming (ILP), Leakage reduction, Negative-bias temperature instability (NBTI), Virtual pin",

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KW - Aging mitigation

KW - Integer linear programming (ILP)

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