NBTI and leakage reduction using ILP-based approach

Ing Chao Lin, Kuan Hui Li, Chia Hao Lin, Kai-Chiang Wu

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


We propose an integer linear programming-based formulation to improve the effectiveness of the transmission gate-based technique intended to reduce negative-bias temperature instability and leakage power consumption. We also propose a virtual input pin technique to improve leakage reduction and use path sensitization to reduce area overhead. Simulation results show that combining these techniques can achieve >51.18% delay improvement and 63.34% leakage power improvement with only 2.31% area overhead.

Original languageEnglish
Article number6607241
Pages (from-to)2034-2038
Number of pages5
JournalIEEE Transactions on Very Large Scale Integration (VLSI) Systems
Issue number9
StatePublished - 1 Jan 2014


  • Aging mitigation
  • Integer linear programming (ILP)
  • Leakage reduction
  • Negative-bias temperature instability (NBTI)
  • Virtual pin

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