Abstract
We propose an integer linear programming-based formulation to improve the effectiveness of the transmission gate-based technique intended to reduce negative-bias temperature instability and leakage power consumption. We also propose a virtual input pin technique to improve leakage reduction and use path sensitization to reduce area overhead. Simulation results show that combining these techniques can achieve >51.18% delay improvement and 63.34% leakage power improvement with only 2.31% area overhead.
Original language | English |
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Article number | 6607241 |
Pages (from-to) | 2034-2038 |
Number of pages | 5 |
Journal | IEEE Transactions on Very Large Scale Integration (VLSI) Systems |
Volume | 22 |
Issue number | 9 |
DOIs | |
State | Published - 1 Jan 2014 |
Keywords
- Aging mitigation
- Integer linear programming (ILP)
- Leakage reduction
- Negative-bias temperature instability (NBTI)
- Virtual pin