Narrow-width effect on high-frequency performance and RF noise of sub-40-nm multifinger nMOSFETs and pMOSFETs

Kuo Liang Yeh*, Jyh-Chyurn Guo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

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Chemical Compounds

Engineering & Materials Science