Multi-spectral terahertz interferometric imaging based on a monolithic retroactive silicon chip

Richard Al Hadi, Yan Zhao, Yilei Li, Yuan Du, Christopher Curwen, Michael K. Lo, Benjamin S. Williams, M. C.Frank Chang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper presents a multi-spectral interferometric method to coherently emit and detect multiple terahertz tones on the same antenna equipped silicon chip without the need of external elements. The method consists of exploiting the reciprocal properties of optical, electromagnetic and electrical components of a silicon integrated terahertz harmonic oscillator allowing it to operate as a source and detector in the same time. We name this method retroactive detection or imaging in contrast with traditional active terahertz imaging systems where a distinct source and detector are needed, this retroactive approach eliminate the need of additional terahertz components. By detecting the reflected terahertz waves on a remote target, images of a coin surface are produced at 0.35 THz, 0.7 THz, 1.05 THz and 1.4 THz. The device operates at room temperature in a continuous-wave mode.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781538631690
DOIs
StatePublished - 28 Jun 2017
Event2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017 - Tel-Aviv, Israel
Duration: 13 Nov 201715 Nov 2017

Publication series

Name2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017
Volume2017-November

Conference

Conference2017 IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems, COMCAS 2017
CountryIsrael
CityTel-Aviv
Period13/11/1715/11/17

Keywords

  • CMOS
  • Cooled terahertz detector
  • Direct power detector
  • Far infrared
  • FTIR
  • Imaging Systems
  • Interferometric Imaging
  • SBD
  • Silicon
  • Spectral response
  • Square-law power detector
  • Terahertz
  • Terahertz detector
  • Terahertz harmonic mixer
  • Terahertz imaging
  • Terahertz interferometry

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