Morphology evolution and crack formation of YBa2Cu3O7 on (110)SrTiO3 substrates

Kaung-Hsiung Wu*, S. P. Chen, Jenh-Yih Juang, T. M. Uen, Y. S. Gou

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The detailed grain evolution of (103)-oriented YBa2Cu3O7 (YBCO) films grown on as-polished and preannealed (110)SrTiO3 was studied using atomic force microscopy (AFM). The scanning laser deposition system used in preparing the films allows us to deposit films with various thicknesses in a single deposition run. The AFM images revealed that although more regular alignment of grains at the initial nucleation for films grown on the pre-annealed substrates, there were no apparent differences in surface structure for the thicker films grown on both as-polished and annealed substrates. It was also found that as the films increased to a critical thickness, microcracks were formed in both cases.

Original languageEnglish
Pages (from-to)575-576
Number of pages2
JournalPhysica C: Superconductivity and its applications
Volume282-287
Issue numberPART 2
DOIs
StatePublished - 1 Jan 1997

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