Morphology evolution and crack formation of YBa2Cu3O7 on (110)SrTiO3 substrates

Kaung-Hsiung Wu; S. P. Chen; Jenh-Yih Juang; T. M. Uen; Y. S. Gou

doi:10.1016/S0921-4534(97)00378-X

Morphology evolution and crack formation of YBa₂Cu₃O₇ on (110)SrTiO₃ substrates

Kaung-Hsiung Wu^*, S. P. Chen, Jenh-Yih Juang, T. M. Uen, Y. S. Gou

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

Abstract

The detailed grain evolution of (103)-oriented YBa₂Cu₃O₇ (YBCO) films grown on as-polished and preannealed (110)SrTiO₃ was studied using atomic force microscopy (AFM). The scanning laser deposition system used in preparing the films allows us to deposit films with various thicknesses in a single deposition run. The AFM images revealed that although more regular alignment of grains at the initial nucleation for films grown on the pre-annealed substrates, there were no apparent differences in surface structure for the thicker films grown on both as-polished and annealed substrates. It was also found that as the films increased to a critical thickness, microcracks were formed in both cases.

Original language	English
Pages (from-to)	575-576
Number of pages	2
Journal	Physica C: Superconductivity and its applications
Volume	282-287
Issue number	PART 2
DOIs	https://doi.org/10.1016/S0921-4534(97)00378-X
State	Published - 1 Jan 1997

Access to Document

10.1016/S0921-4534(97)00378-X

Fingerprint Dive into the research topics of 'Morphology evolution and crack formation of YBa2Cu3O7 on (110)SrTiO3 substrates'. Together they form a unique fingerprint.

Cite this

@article{93aeb8f71f9e4b46b32cd2264cb3f945,

title = "Morphology evolution and crack formation of YBa2Cu3O7 on (110)SrTiO3 substrates",

abstract = "The detailed grain evolution of (103)-oriented YBa2Cu3O7 (YBCO) films grown on as-polished and preannealed (110)SrTiO3 was studied using atomic force microscopy (AFM). The scanning laser deposition system used in preparing the films allows us to deposit films with various thicknesses in a single deposition run. The AFM images revealed that although more regular alignment of grains at the initial nucleation for films grown on the pre-annealed substrates, there were no apparent differences in surface structure for the thicker films grown on both as-polished and annealed substrates. It was also found that as the films increased to a critical thickness, microcracks were formed in both cases.",

author = "Kaung-Hsiung Wu and Chen, {S. P.} and Jenh-Yih Juang and Uen, {T. M.} and Gou, {Y. S.}",

year = "1997",

month = jan,

day = "1",

doi = "10.1016/S0921-4534(97)00378-X",

language = "English",

volume = "282-287",

pages = "575--576",

journal = "Physica C: Superconductivity and its Applications",

issn = "0921-4534",

publisher = "Elsevier",

number = "PART 2",

}

TY - JOUR

T1 - Morphology evolution and crack formation of YBa2Cu3O7 on (110)SrTiO3 substrates

AU - Wu, Kaung-Hsiung

AU - Chen, S. P.

AU - Juang, Jenh-Yih

AU - Uen, T. M.

AU - Gou, Y. S.

PY - 1997/1/1

Y1 - 1997/1/1

N2 - The detailed grain evolution of (103)-oriented YBa2Cu3O7 (YBCO) films grown on as-polished and preannealed (110)SrTiO3 was studied using atomic force microscopy (AFM). The scanning laser deposition system used in preparing the films allows us to deposit films with various thicknesses in a single deposition run. The AFM images revealed that although more regular alignment of grains at the initial nucleation for films grown on the pre-annealed substrates, there were no apparent differences in surface structure for the thicker films grown on both as-polished and annealed substrates. It was also found that as the films increased to a critical thickness, microcracks were formed in both cases.

AB - The detailed grain evolution of (103)-oriented YBa2Cu3O7 (YBCO) films grown on as-polished and preannealed (110)SrTiO3 was studied using atomic force microscopy (AFM). The scanning laser deposition system used in preparing the films allows us to deposit films with various thicknesses in a single deposition run. The AFM images revealed that although more regular alignment of grains at the initial nucleation for films grown on the pre-annealed substrates, there were no apparent differences in surface structure for the thicker films grown on both as-polished and annealed substrates. It was also found that as the films increased to a critical thickness, microcracks were formed in both cases.

UR - http://www.scopus.com/inward/record.url?scp=0031207256&partnerID=8YFLogxK

U2 - 10.1016/S0921-4534(97)00378-X

DO - 10.1016/S0921-4534(97)00378-X

M3 - Article

AN - SCOPUS:0031207256

VL - 282-287

SP - 575

EP - 576

JO - Physica C: Superconductivity and its Applications

JF - Physica C: Superconductivity and its Applications

SN - 0921-4534

IS - PART 2

ER -

Morphology evolution and crack formation of YBa₂Cu₃O₇ on (110)SrTiO₃ substrates

Abstract

Access to Document

Other files and links

Fingerprint Dive into the research topics of 'Morphology evolution and crack formation of YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub> on (110)SrTiO<sub>3</sub> substrates'. Together they form a unique fingerprint.

Cite this