Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era

Yu Shin Kuo; Huan Kai Peng; Charles H.P. Wen

doi:10.1109/ISCAS.2010.5537775

Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era

Yu Shin Kuo^*, Huan Kai Peng, Charles H.P. Wen

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Variation in the deep sub-micron eras has made soft error rates (SERs) more statistical and difficult to capture using static analysis. Therefore, this paper presents a Monte-Carlo based SER analysis considering the statistical impact due to variation. Quasirandom sequences are also incorporated for fast convergence of SER accuracy and time efficiency. Experiments show that the proposed framework yields more accurate SERs compared to static analysis. On top of 10⁶X speedup compared to Monte Carlo SPICE simulation, an additional 2.4X speedup can also be observed in the proposed framework after applying quasirandom sequences.

Original language	English
Title of host publication	ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems
Subtitle of host publication	Nano-Bio Circuit Fabrics and Systems
Pages	3673-3676
Number of pages	4
DOIs	https://doi.org/10.1109/ISCAS.2010.5537775
State	Published - 31 Aug 2010
Event	2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010 - Paris, France Duration: 30 May 2010 → 2 Jun 2010

Publication series

Name	ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems

Conference

Conference	2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010
Country	France
City	Paris
Period	30/05/10 → 2/06/10

Access to Document

10.1109/ISCAS.2010.5537775

Link to publication in Scopus

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Kuo, Y. S., Peng, H. K., & Wen, C. H. P. (2010). Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. In ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems (pp. 3673-3676). [5537775] (ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems). https://doi.org/10.1109/ISCAS.2010.5537775

Kuo, Yu Shin ; Peng, Huan Kai ; Wen, Charles H.P. / Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 2010. pp. 3673-3676 (ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems).

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title = "Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era",

abstract = "Variation in the deep sub-micron eras has made soft error rates (SERs) more statistical and difficult to capture using static analysis. Therefore, this paper presents a Monte-Carlo based SER analysis considering the statistical impact due to variation. Quasirandom sequences are also incorporated for fast convergence of SER accuracy and time efficiency. Experiments show that the proposed framework yields more accurate SERs compared to static analysis. On top of 106X speedup compared to Monte Carlo SPICE simulation, an additional 2.4X speedup can also be observed in the proposed framework after applying quasirandom sequences.",

author = "Kuo, {Yu Shin} and Peng, {Huan Kai} and Wen, {Charles H.P.}",

year = "2010",

month = aug,

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doi = "10.1109/ISCAS.2010.5537775",

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series = "ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems",

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note = "null ; Conference date: 30-05-2010 Through 02-06-2010",

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Kuo, YS, Peng, HK & Wen, CHP 2010, Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. in ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems., 5537775, ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, pp. 3673-3676, 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, ISCAS 2010, Paris, France, 30/05/10. https://doi.org/10.1109/ISCAS.2010.5537775

Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. / Kuo, Yu Shin; Peng, Huan Kai; Wen, Charles H.P.

ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 2010. p. 3673-3676 5537775 (ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - Variation in the deep sub-micron eras has made soft error rates (SERs) more statistical and difficult to capture using static analysis. Therefore, this paper presents a Monte-Carlo based SER analysis considering the statistical impact due to variation. Quasirandom sequences are also incorporated for fast convergence of SER accuracy and time efficiency. Experiments show that the proposed framework yields more accurate SERs compared to static analysis. On top of 106X speedup compared to Monte Carlo SPICE simulation, an additional 2.4X speedup can also be observed in the proposed framework after applying quasirandom sequences.

AB - Variation in the deep sub-micron eras has made soft error rates (SERs) more statistical and difficult to capture using static analysis. Therefore, this paper presents a Monte-Carlo based SER analysis considering the statistical impact due to variation. Quasirandom sequences are also incorporated for fast convergence of SER accuracy and time efficiency. Experiments show that the proposed framework yields more accurate SERs compared to static analysis. On top of 106X speedup compared to Monte Carlo SPICE simulation, an additional 2.4X speedup can also be observed in the proposed framework after applying quasirandom sequences.

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Kuo YS, Peng HK, Wen CHP. Monte-Carlo-based statistical soft error rate (SSER) analysis for the deep sub-micron era. In ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems. 2010. p. 3673-3676. 5537775. (ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems). https://doi.org/10.1109/ISCAS.2010.5537775