Modeling the Switch-Induced Error Voltage on a Switched-Capacitor

Bing J. Sheu, Chen-Ming Hu

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

An analytical model for switch-induced error voltage on a switched capacitor is derived. A compact expression contains the effects of gate voltage falling rate, threshold voltage, and storage capacitance. It can be used to quickly predict the error voltage. The model is in good agreement with computer simulations using SPICE program and experiment.

Original languageEnglish
Pages (from-to)911-913
Number of pages3
JournalIEEE transactions on circuits and systems
Volume30
Issue number12
DOIs
StatePublished - 1 Jan 1983

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