Modeling of quasi-ballistic transport in nanowire metal-oxide-semiconductor field-effect transistors

Yeonghun Lee, Kuniyuki Kakushima, Kenji Natori, Hiroshi Iwai

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


We developed a semi-analytical quasi-ballistic transport model for the nanowire metal-oxide-semiconductor field-effect transistors, dealing with finite lengths of source, channel, and drain. For the modeling, we used a combination of one-flux scattering matrices and analytical solutions of Boltzmann transport equations. The developed model was in quantitatively good agreement with numerical results, and well represented intermediate-scaled devices. In addition, we illustrated that the finite source seriously affect the distribution function of the carriers injected from the source, and the finite drain does for the backscattering into the channel from the drain. Finally, our model and results would help to understand physical aspects regarding quasi-ballistic transport in nanoscale devices.

Original languageEnglish
Article number155105
JournalJournal of Applied Physics
Issue number15
StatePublished - 21 Oct 2015

Fingerprint Dive into the research topics of 'Modeling of quasi-ballistic transport in nanowire metal-oxide-semiconductor field-effect transistors'. Together they form a unique fingerprint.

Cite this