Microwave penetration depth measurement for high Tc superconductors by dielectric resonators

Hang Ting Lue*, Juh Tzeng Lue, Tseung-Yuen Tseng

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

The penetration depth λ(T) dependence on temperatures for high Tc superconducting YBa2Cu3O7-δ thin films stored in various environments was measured by a well-designed microwave dielectric resonator. A d-wave T2 dependence was observed at low temperatures, while an exponential dependence of the penetration depth λ(T) relevant to the s wave was detected as temperature increases due to thermal fluctuation. An abnormal upturn of the penetration depth at temperatures below 10 K attributed to the surface current carried by the defect surface-induced Andreev bound states can be apparently observed without applying heavy-ion bombardment from this relatively higher frequency measurement. Readers who endeavor to start this kind of measurement can use the well-modified dielectric cavity in conjunction with the detailed measuring procedure.

Original languageEnglish
Article number1017712
Pages (from-to)433-439
Number of pages7
JournalIEEE Transactions on Instrumentation and Measurement
Volume51
Issue number3
DOIs
StatePublished - 1 Jun 2002

Keywords

  • d-wave symmetry
  • High T superconductors
  • Microwave dielectric resonator
  • Penetration depth
  • Surface Andreev bound states

Fingerprint Dive into the research topics of 'Microwave penetration depth measurement for high T<sub>c</sub> superconductors by dielectric resonators'. Together they form a unique fingerprint.

Cite this