Abstract
The penetration depth λ(T) dependence on temperatures for high Tc superconducting YBa2Cu3O7-δ thin films stored in various environments was measured by a well-designed microwave dielectric resonator. A d-wave T2 dependence was observed at low temperatures, while an exponential dependence of the penetration depth λ(T) relevant to the s wave was detected as temperature increases due to thermal fluctuation. An abnormal upturn of the penetration depth at temperatures below 10 K attributed to the surface current carried by the defect surface-induced Andreev bound states can be apparently observed without applying heavy-ion bombardment from this relatively higher frequency measurement. Readers who endeavor to start this kind of measurement can use the well-modified dielectric cavity in conjunction with the detailed measuring procedure.
Original language | English |
---|---|
Pages (from-to) | 433-439 |
Number of pages | 7 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 51 |
Issue number | 3 |
DOIs | |
State | Published - 1 Jun 2002 |
Keywords
- d-wave symmetry
- High T superconductors
- Microwave dielectric resonator
- Penetration depth
- Surface Andreev bound states