Microstructure of a-plane ZnO grown on LaAlO3 (001)

Wei Lin Wang, Chun Yen Peng, Yen Teng Ho, Li Chang*

*Corresponding author for this work

Research output: Contribution to journalArticle

8 Scopus citations

Abstract

The microstructure of a-plane ZnO grown on LaAlO3 (LAO) (001) has been systematically investigated by employing X-ray diffraction (XRD), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). Based on the results of XRD and TEM, only a-plane ZnO has been found to grow on LAO (001), and it consists of two types of domains perpendicular to each other. The crystal orientation relationships of a-plane ZnO domains with LAO have been verified to be [0001]ZnO//[110]LAO and [11̄00]ZnO//[11̄0]LAO. The domain boundaries in the a-plane ZnO are along the direction in a rotation angle of about 45° from the c-axes of ZnO. The surface morphology of ZnO films in SEM exhibits domain structure in stripe-like shape. The formation of two domains can be attributed to the cubic symmetry of the surface configuration of LAO (001).

Original languageEnglish
Pages (from-to)2967-2970
Number of pages4
JournalThin Solid Films
Volume518
Issue number11
DOIs
StatePublished - 31 Mar 2010

Keywords

  • a-plane ZnO
  • Domains
  • LaAlO
  • Microstructure

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