Microstructure and recording mechanism of Bi-Fe-(N) layer for high-density write-once optical disk

Hung Chuan Mai, Tsung-Eong Hsien*, Shiang Yao Jeng, Chong Ming Chen, Jen Long Wang

*Corresponding author for this work

Research output: Contribution to journalArticle

8 Scopus citations

Abstract

Bi-Fe-(N) thin film as the recording layer of high density digital versatile disk recordable optical disk was developed. For the disk sample with optimized layer structure, maximum partial response signal to noise ratio of 21.1 and minimum simulated bit error rate of 5× 10-7 were achieved at the write power=5.7 mW. Transmission electron microscopy characterization illustrated that the separation of Bi and Fe elements to form the coarse granular structure in the mark regime during laser irradiation comprised of the recording mechanism.

Original languageEnglish
Article number021906
JournalApplied Physics Letters
Volume92
Issue number2
DOIs
StatePublished - 28 Jan 2008

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